JPH02150583U - - Google Patents

Info

Publication number
JPH02150583U
JPH02150583U JP6074589U JP6074589U JPH02150583U JP H02150583 U JPH02150583 U JP H02150583U JP 6074589 U JP6074589 U JP 6074589U JP 6074589 U JP6074589 U JP 6074589U JP H02150583 U JPH02150583 U JP H02150583U
Authority
JP
Japan
Prior art keywords
under test
signal
terminal
response
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6074589U
Other languages
English (en)
Japanese (ja)
Other versions
JP2548477Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989060745U priority Critical patent/JP2548477Y2/ja
Publication of JPH02150583U publication Critical patent/JPH02150583U/ja
Application granted granted Critical
Publication of JP2548477Y2 publication Critical patent/JP2548477Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP1989060745U 1989-05-24 1989-05-24 Ｉｃ試験装置 Expired - Lifetime JP2548477Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989060745U JP2548477Y2 (ja) 1989-05-24 1989-05-24 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989060745U JP2548477Y2 (ja) 1989-05-24 1989-05-24 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH02150583U true JPH02150583U (en]) 1990-12-26
JP2548477Y2 JP2548477Y2 (ja) 1997-09-24

Family

ID=31588375

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989060745U Expired - Lifetime JP2548477Y2 (ja) 1989-05-24 1989-05-24 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2548477Y2 (en])

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853776A (ja) * 1981-09-25 1983-03-30 Nec Corp 集積回路測定機
JPS6217668A (ja) * 1985-07-17 1987-01-26 Yokogawa Electric Corp 半導体集積回路検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5853776A (ja) * 1981-09-25 1983-03-30 Nec Corp 集積回路測定機
JPS6217668A (ja) * 1985-07-17 1987-01-26 Yokogawa Electric Corp 半導体集積回路検査装置

Also Published As

Publication number Publication date
JP2548477Y2 (ja) 1997-09-24

Similar Documents

Publication Publication Date Title
ATE50654T1 (de) Einrichtung zur muenzenpruefung.
EP0849743A3 (en) Built-in self test memory devices
EP0396272A3 (en) Ic device including test circuit
JPH02150583U (en])
EP0388784A3 (en) Method and apparatus for high speed integrated circuit testing
JPH0361588U (en])
JPS5546578A (en) Method of mounting integrated circuit
JPS5651677A (en) Testing method
JPS647636A (en) Semiconductor integrated circuit device with gate array and memory
JPS5848580Y2 (ja) 指示・記録計
JPS6046078U (ja) 集積回路検査装置
JPS6145659Y2 (en])
JPH0481080U (en])
JPS6433083U (en])
JPS6212884U (en])
JPS62115682U (en])
JPH02144784U (en])
JPS54105669A (en) Analog input device
JPH0727940B2 (ja) Ｉｃメモリ試験装置
JPS6086978U (ja) プリント板試験装置
JPH0419047U (en])
JPS62100732U (en])
JPS63133738U (en])
JPS6142181U (ja) テレビジヨン用の信号対雑音比測定回路
JPS62124570U (en])

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term